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Special Lectures on STM/STS
by
Tomihiro Hashizume
Nanoprocess Research Dep.,
Center for Technology Innovation-Electronics,
HITACHI, Ltd.

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PLACE:
      A3-824 Lecture Room, Institute of Engineering, Hiroshima Univ.
TIME SCHEDULE:
      May 23(Tue) 3 periods (12:50-17:50)
      May 24(Wed) 3 periods (10:30-16:05)
      May 25(Thu) 2 periods (10:30-14:20)
      June 5(Mon) 3 periods (10:30-16:05)
      June 6(Tue) 3 periods (12:50-17:50)
      June 7(Wed) 1 period (10:30-12:00)
CLASS SCHEDULE
      1. Introduction to surface physics
      2. Surface electronic states and the first]principle calculation
      3. Fundamental of STM
      4. Fundamental of SPM and its resolution
      5. Measurement method of structure of surface, surface electronic state, and composition
      6. Experimental method of STM/SPM
      7. Control system of STM/SPM
      8. Observation of surface structure
      9. Fulleren, graphene, carbon nanotubes
     10. Atomic manipulation
     11. Hydrogen-terminated silicon surface
     12. Evaluation of nano-device
     13. Organic thin film transistor
     14. Evaluation of biological specimen
     15. Summary

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ABSTRACT
Scanning tunneling microscope/Scanning Tunneling Spectroscopy (STM/STS) is the measurement method to observe a surface roughness and an electronic state with spatial resolution at the atomic level using a pungent probe. Scanning probe microscopy (SPM) derived from STM enables us to observe the bleed out of physical media such as the interatomic force, the electromagnetic field, and the light, and moreover, to make the picture of a physical information of a sample surface with a high resolution. In these lectures I introduce a theoretical and computational method to understand several physical phenomena of a solid surface, and the numerical method to analyze its structure, electronic state, and composition. In particular, I introduce the fundamental of STM/STS and the important control system of STM/SPM. As some topics, in addition, I explain the Hydrogen-terminated silicon surface, the application to the evaluation of the SPM nano-device, the application to the organic thin film transistor, and the evaluation of biological specimen.

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